Microscopy and Analytical Imaging


Nersic performs Analytical Imaging using sophisticated microscopes with different techniques to create images, samples and objects that is not possible to see them with the naked eye. Visible light, infrared light, X-ray light, electrons, metal ions or gaseous ions are being used by different imaging techniques listed in the following, to produce high spatial resolution images and such images can be from different depths of the sample including, surface structures & defects, sub-surface structures, intact bulk structures and atomic or Nano-scale structures & defects.
• Environmental Scanning Electron Microscopy (E-SEM)
• Field Emission Scanning Electron Microscopy (FE-SEM)
• Focused Ion Beam with Scanning Electron Microscopy (FIB-SEM)
• High Resolution Optical Microscopy
• Scanning Transmission Electron Microscopy (STEM)
• Transmission Electron Microscopy (TEM)