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Material Characterization and Evaluation

pic13Nersic provide both chemical and physical Imaging type information for material characterization. For new product development, execute concept validation and/or prototype evaluation, quality control of first production lot or pilot lot, or investigation the cause of a failure, Nersic proposes highly advanced materials characterization of devices and processes such as, Surface Chemical Analysis (Electron Spectroscopy for Chemical Analysis, X-ray Photoelectron Spectroscopy, XPS Element & Chemical State Mapping, XPS Line Profiling), Near Surface Chemical Analysis (Energy Dispersive X-ray Spectroscopy, EDS Element Mapping, EDS Line Profiling), Atomic & NanoScale Chemical Analysis (Electron Energy Loss Spectrometry, Energy Dispersive X-ray Spectroscopy), Surface Imaging (Ultra High Resolution-SEM, Focused Ion Beam with Scanning Electron Microscopy, High Resolution Optical Microscopy), Defect Analysis, and Analytical Imaging.
Nersic also has the expertise in Evaluation of Materials to measure the levels of cleanliness and if a material or component will enter contamination. The test can be carried out on different sample type and parts including but not limited to, Wafer carriers/shippers/FOUPs/clams, Brass valves, Filters and components, Piping material, Tubing or hoses, Wipes, rollers and brushes, Gloves, Wet bench material (vapors of acids, bases), De-Ionized water systems and HEPA/ULPA filters.