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Depth Profiling

Depth ProfilingWe analyzes the element or chemical content of a sample as a function of its depth either by constant monitoring specific species of interest with respect to depth (e.g. SIMS), or in a stepwise mode by removing material, determining, and then repeating the process (e.g. XPS or Auger). The thickness of the layers of interest and the required limits of detection (or that are attainable) are main factors in choosing the appropriate technique(s) for a given sample. Our laboratory extensively use XPS, SIMS and Confocal Raman Spectroscopy for many years to obtain depth profiles under optimized conditions without introducing artifacts.